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Patterning via Optical Saturable Transitions - Fabrication and Characterization
Published on: December 11, 2014
Bringing order to the world of nanowire devices by phase shift lithography
Kittitat Subannajui1, Firat Güder, Margit Zacharias
1Nanotechnology, Institute of Microsystems Engineering (IMTEK), Albert-Ludwigs-University Freiburg, Georges-Koehler-Allee 103, 79110 Freiburg, Germany. kittitat.subannajui@imtek.uni-freiburg.de
Abstract:
Semiconductor nanowire devices have several properties which match future requirements of scaling down the size of electronics. In typical microelectronics production, a number of microstructures are aligned precisely on top of each other during the fabrication process. In the case of nanowires, this mandatory condition is still hard to achieve. A technological breakthrough is needed to accurately place nanowires at any specific position and then form devices in mass production. In this article, an upscalable process combining conventional micromachining with phase shift lithography will be demonstrated as a suitable tool for nanowire device technology. Vertical Si and ZnO nanowires are demonstrated on very large (several cm(2)) areas. We demonstrate how the nanowire positions can be controlled, and the resulting nanowires are used for device fabrication. As an example Si/ZnO heterojunction diode arrays are fabricated. The electrical characterization of the produced devices has also been performed to confirm the functionality of the fabricated diodes.

