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Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.

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Related Experiment Video

Updated: Jun 6, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
10:39

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Published on: October 11, 2016

Transmission gratings for beam sampling and beam splitting.

E K Popov, E G Loewen, M Neviére

    Applied Optics
    |November 19, 2010
    PubMed
    Summary

    Transmission gratings can now be used for beam sampling, a novel application. This is enabled by unique dielectric overcoatings and adaptable thin metal coatings, expanding their utility beyond beam splitting.

    Area of Science:

    • Optics and Photonics
    • Materials Science

    Background:

    • Transmission gratings are primarily utilized as beam splitters.
    • Their application in beam sampling is limited due to specific dielectric overcoating requirements.

    Purpose of the Study:

    • To introduce novel applications of transmission gratings for beam sampling.
    • To describe unique dielectric overcoating properties for this purpose.
    • To explore modifications using thin metal coatings.

    Main Methods:

    • Investigation of specialized dielectric overcoatings for transmission gratings.
    • Adaptation of transmission grating principles using thin metal coatings.

    Main Results:

    • Demonstration of transmission gratings' suitability for beam sampling.

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    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
    10:12

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

    Published on: June 19, 2018

    Related Experiment Videos

    Last Updated: Jun 6, 2026

    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
    10:39

    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

    Published on: October 11, 2016

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
    10:12

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

    Published on: June 19, 2018

  • Characterization of novel dielectric overcoating properties.
  • Successful modification of gratings with thin metal coatings.

    • Conclusions:

    • Transmission gratings can be effectively employed for beam sampling.
    • The described dielectric overcoatings represent a new development.
    • Thin metal coatings offer an alternative method for modifying grating properties.