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Simulation method for interference fringe patterns in measuring gear tooth flanks by laser interferometry.

Suping Fang1, Leijie Wang, Masaharu Komori

  • 1State Key Laboratory of Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an 710049, China. spfang@mail.xjtu.edu.cn

Applied Optics
|November 25, 2010
PubMed
Summary
This summary is machine-generated.

A new ray-tracing method simulates interference fringe patterns (IFPs) for precise gear tooth flank measurement. This simulation accurately predicts IFPs, validated by experimental results from a two-path interferometer.

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Area of Science:

  • Optical Engineering
  • Metrology
  • Mechanical Engineering

Background:

  • Accurate measurement of gear tooth flanks is crucial for performance and longevity.
  • Existing methods for gear metrology may have limitations in precision or complexity.
  • Interference fringe patterns (IFPs) offer a promising approach for high-resolution surface analysis.

Purpose of the Study:

  • To develop and validate a novel ray-tracing-based simulation method for interference fringe patterns (IFPs).
  • To enable accurate measurement of gear tooth flank profiles using a two-path interferometer.
  • To bridge the gap between simulation and experimental verification in optical metrology for gears.

Main Methods:

  • A two-step ray-tracing simulation was employed to generate IFPs.
  • Step 1: Ray tracing within the interferometer's object path to define the IFP profile.
  • Step 2: Mapping optical path length to fringe gray level to fill the IFP with fringes.

Main Results:

  • Simulations were performed for two spur involute gears.
  • The simulated IFPs were experimentally verified using a custom-built two-path interferometer.
  • The method demonstrated high accuracy in predicting interference fringe patterns for gear metrology.

Conclusions:

  • The presented ray-tracing method provides a reliable tool for simulating IFPs for gear tooth flank measurement.
  • The validated simulation method can aid in the design and optimization of interferometric measurement systems.
  • This approach enhances the precision and efficiency of gear metrology through accurate optical simulations.