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Directional reflectance characterization facility and measurement methodology.

B T McGuckin, D A Haner, R T Menzies

|November 25, 2010

Summary

This summary is machine-generated.

A new facility precisely measures Spectralon reflectance for NASA's MISR instrument. This system achieves high accuracy (±0.002) for calibrating in-flight instruments.

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Area of Science:

Optical Engineering
Remote Sensing Instrument Calibration
Materials Science

Background:

Accurate in-flight calibration is crucial for remote sensing data quality.
Spectralon panels are widely used as calibration targets due to their Lambertian properties.
The NASA Multiangle Imaging Spectrometer (MISR) requires precise characterization of its calibration targets.

Purpose of the Study:

To describe a precision reflectance characterization facility.
To measure the bidirectional reflectance properties of Spectralon panels.
To ensure the accuracy of Spectralon panels used as in-flight calibrators for the MISR instrument.

Main Methods:

Utilized a facility with polarized laser radiation at 442, 632.8, and 859.9 nm.
Employed a silicon photodetector on a 360° revolving boom to measure reflected radiance.
Ratioed detector signals with a reference detector to minimize laser source instabilities.
Implemented a computer-controlled three-axis rotational assembly for precise panel positioning (0.001° resolution).

Main Results:

Achieved a measurement precision of ±0.002 for bidirectional reflection function (BRF) at the 1σ confidence level.
Demonstrated high angular positioning accuracy and repeatability for the Spectralon test panel.
Successfully characterized the reflectance properties of Spectralon panels for MISR calibration.

Conclusions:

The developed facility provides high-precision characterization of Spectralon reflectance.
The facility meets the stringent requirements for calibrating the MISR instrument.
This work contributes to the reliability and accuracy of remote sensing data.