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Related Concept Videos

Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview01:13

Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview

Attenuated total reflectance (ATR) infrared spectroscopy is a powerful analytical technique used to study the composition of materials. It is widely employed in chemistry, materials science, forensic science, and other fields where sample characterization is required. ATR has several advantages over traditional transmission IR spectroscopy, including the requirement of little to no sample preparation and the ability to analyze a wide range of samples.
The ATR process begins by directing a beam...
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.

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Related Experiment Video

Updated: Jun 6, 2026

Simulation, Fabrication and Characterization of THz Metamaterial Absorbers
13:44

Simulation, Fabrication and Characterization of THz Metamaterial Absorbers

Published on: December 27, 2012

Multilayer reflectors with absent higher-order reflectance bands.

P Baumeister

    Applied Optics
    |November 25, 2010
    PubMed
    Summary

    Explicit equations provide refractive indices for all-dielectric multilayers. These structures reflect longer wavelengths while transmitting shorter ones, useful for optical filters.

    Area of Science:

    • Optics and Photonics
    • Materials Science

    Background:

    • All-dielectric multilayers are crucial optical components.
    • Designing these structures requires precise control over refractive indices.

    Purpose of the Study:

    • To present explicit equations for calculating refractive indices in all-dielectric multilayers.
    • To provide equations for simulated rugate reflectors.

    Main Methods:

    • Derivation of explicit equations for refractive indices.
    • Modeling of all-dielectric multilayer structures.

    Main Results:

    • Equations for refractive indices enabling specific reflection and transmission properties.
    • Formulations applicable to simulated rugate reflectors.

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    Fabrication of Ultra-thin Color Films with Highly Absorbing Media Using Oblique Angle Deposition
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    Last Updated: Jun 6, 2026

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    Conclusions:

    • The presented equations facilitate the design of advanced optical filters.
    • This work aids in the development of broadband transmitting and narrowband reflecting multilayer coatings.