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Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy

K Mitsuishi1, A Hashimoto, M Takeguchi

  • 1Quantum Dot Research Center, National Institute for Materials Science, 3-13 Sakura, Tsukuba 305-0005, Japan. Mitsuishi.Kazutaka@nims.go.jp

Ultramicroscopy
|November 30, 2010
PubMed

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