New method for characterizing paper coating structures using argon ion beam milling and field emission scanning

C Dahlström1, R Allem, T Uesaka

  • 1Fibre Science and Communication Network, Mid Sweden University, Sundsvall, Sweden FPInnovations, Pointe-Claire, QC, Canada. christina.dahlstrom@miun.se

Journal of Microscopy
|December 2, 2010
PubMed
Summary

A new method using argon ion beam milling and scanning electron microscopy improves paper coating microstructure analysis. This technique accurately quantifies porosity and reveals binder migration, unlike conventional methods.