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Updated: Jun 6, 2026

Simultaneous Brightfield, Fluorescence, and Optical Coherence Tomographic Imaging of Contracting Cardiac Trabeculae Ex Vivo
Published on: October 2, 2021
Spectrally resolved phase-shifting interference microscopy: technique based on optical coherence tomography for
Sanjit K Debnath1, Seung-Woo Kim, Mahendra P Kothiyal
1New Product Development Division, Korean Materials & Analysis Corporation, 554 Youngsan-dong, Yuseong-gu, Daejeon, 305-500, South Korea. debnath.sanjit@gmail.com
Abstract:
Spectrally resolved white-light phase-shifting interference microscopy has been used for measurements of the thickness profile of a transparent thin-film layer deposited upon a patterned structure exhibiting steps and discontinuities. We describe a simple technique, using an approach based on spectrally resolved optical coherence tomography, that makes it possible to obtain directly a thickness profile along a line by inverse Fourier transformation of the complex spectral interference function.
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