Spectrally resolved phase-shifting interference microscopy: technique based on optical coherence tomography for

Sanjit K Debnath1, Seung-Woo Kim, Mahendra P Kothiyal

  • 1New Product Development Division, Korean Materials & Analysis Corporation, 554 Youngsan-dong, Yuseong-gu, Daejeon, 305-500, South Korea. debnath.sanjit@gmail.com

Applied Optics
|December 3, 2010
PubMed