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Updated: Jun 6, 2026

High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings
Published on: April 16, 2017
Simultaneous measurement of emittance, transmittance, and reflectance of semitransparent materials at elevated
Sangho Jeon1, Seung-Nam Park, Yong Shim Yoo
1Division of Physical Metrology, Korea Research Institute of Standards and Science, 209 Gajeong-ro, Yuseong-gu, Daejeon 305-340, South Korea.
Abstract:
A two-substrate method is developed to simultaneously determine emissivity, transmittance, and reflectance of semitransparent materials with a single measurement under the same environment at elevated temperature. The three quantities can be obtained through the emissivities of substrates and the apparent emissivities resulting from the radiance of the sample heated by substrates. The two-substrate method is compared with the conventional method by measuring sapphire samples with various thicknesses, resulting in good agreements for all the samples. The present method will be useful to measure the temperature dependence of optical properties of porous ceramic materials.
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