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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

Experimental demonstration of a phased-array antenna optically controlled with phase and time delays

D Dolfi, P Joffre, J Antoine

    Applied Optics
    |December 4, 2010
    PubMed

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