Related Experiment Video
Updated: Jun 6, 2026

The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
Published on: December 5, 2025
Measurement of surface temperature and emissivity by a multitemperature method for Fourier-transform infrared
Abstract:
Surface temperatures are estimated with high precision based on a multitemperature method for Fourier-transform spectrometers. The method is based on Planck's radiation law and a nonlinear least-squares fitting algorithm applied to two or more spectra at different sample temperatures and a single measurement at a known sample temperature, for example, at ambient temperature. The temperature of the sample surface can be measured rather easily at ambient temperature. The spectrum at ambient temperature is used to eliminate background effects from spectra as measured at other surface temperatures. The temperatures of the sample are found in a single calculation from the measured spectra independently of the response function of the instrument and the emissivity of the sample. The spectral emissivity of a sample can be measured if the instrument is calibrated against a blackbody source. Temperatures of blackbody sources are estimated with an uncertainty of 0.2-2 K. The method is demonstrated for measuring the spectral emissivity of a brass specimen and an oxidized nickel specimen.
Related Concept Videos
IR Spectrometers
Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview
The ATR process begins by directing a beam...
Infrared (IR) Spectroscopy: Overview
Different compounds display unique properties due to their...
Spectrophotometry: Introduction
The essential components of a spectrophotometer include a source of electromagnetic radiation, a slot for placing a material to be analyzed, and a...
Interaction of EM Radiation with Matter: Spectroscopy
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.

