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[Developments and trends of the computed tomography imaging spectrometers]
Ru-yi Wei1, Jin-song Zhou, Juan-juan Jing
1Key Laboratory of Spectral Imaging Technology, Chinese Academy of Science, Xi'an Institute of Optics and Precision Mechanics of Chinese Academy of Sciences, Xi'an 710119, China. weiruyi5@yahoo.com.cn
This review explores computed tomography imaging spectrometer (CTIS) systems, detailing technological advancements and research trends. It covers system improvements, novel components, calibration, algorithms, and expanding applications in spectral bands.
Area of Science:
- Spectroscopy
- Optical Engineering
- Imaging Science
Context:
- Computed Tomography Imaging Spectrometers (CTIS) are advanced optical systems.
- Significant global research focuses on enhancing CTIS capabilities.
- Existing CTIS systems require continuous development for broader applications.
Purpose:
- To provide a comprehensive review of CTIS measurement systems.
- To analyze technological characteristics and research focuses of CTIS.
- To summarize the development, application, and future trends of CTIS.
Summary:
- This paper reviews global CTIS measurement systems, examining technological characteristics and research trends.
- Developments include improved system structures, novel grating elements, detectors, apparatus, calibration methods, and reconstruction algorithms.
- The review also covers the extension of spectral bands and application fields, introducing non-scanning and high-throughput CTIS principles, and discussing future trends.
Impact:
- Provides a consolidated overview of CTIS technology for researchers and engineers.
- Highlights key advancements and potential future directions in CTIS development.
- Facilitates understanding of CTIS capabilities across various spectral bands and application domains.
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