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Crystallographic structural analysis in atom probe microscopy via 3D Hough transformation
L Yao1, M P Moody, J M Cairney
1Australian Centre for Microscopy and Microanalysis, The University of Sydney, NSW 2006, Australia.
Ultramicroscopy
|December 15, 2010
Summary
Atom probe tomography can now determine crystal structure with high resolution. This new method enables precise crystallographic analysis and automated reconstruction for materials science.
Area of Science:
- Materials Science
- Crystallography
- Microscopy
Background:
- Atom probe tomography (APT) is primarily recognized for 3D chemical microanalysis.
- Existing methods offer high chemical and spatial resolution but limited crystallographic detail.
Purpose of the Study:
- To demonstrate APT's capability for detailed crystallographic determinations.
- To introduce a novel method for quantitative crystal structure analysis using APT data.
Main Methods:
- Utilizing a Hough transformation on reconstructed atom probe data.
- Applying the method to determine plane spacings and angles.
- Analyzing crystal geometry around a grain boundary.
Main Results:
- Achieved high-resolution quantitative determination of crystal structure.
- Identified discontinuous crystallographic planes in semiconducting materials.
- Demonstrated utility for optimizing tomographic reconstruction.
Conclusions:
- Atom probe tomography can be effectively used for crystallographic analysis.
- The new method enhances the application of APT in materials science.
- Enables automated spatial analysis and tomographic reconstruction in APT.
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