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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

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Measurement error caused by speckle noise in heterodyne and quasi-heterodyne holographic interferometry

Q Fang

    Applied Optics
    |December 15, 2010
    PubMed

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