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Fibre-top atomic force microscope probe with optical near-field detection capabilities.

B Tiribilli¹, G Margheri, P Baschieri

¹Institute of Complex Systems, National Research Council, Sesto Fiorentino, Italy.

Journal of Microscopy

|December 16, 2010

Summary

A novel fiber-top probe detects optical tunneling signals for advanced microscopy. This technology enables hybrid probes combining atomic force microscopy and scanning near-field optical microscopy.

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Area of Science:

Optical physics
Nanotechnology
Microscopy

Background:

Developing advanced probes for high-resolution imaging is crucial.
Integrating multiple microscopy techniques offers synergistic advantages.
Optical tunneling and cantilever deflection are key physical phenomena.

Purpose of the Study:

To present a novel fiber-top probe.
To demonstrate its capability in detecting optical tunneling signals.
To explore its potential for hybrid microscopy applications.

Main Methods:

Fabrication of a tipped cantilever on an optical fiber, with the tip aligned to the fiber core.
Utilizing total internal reflection on an optical prism.
Detecting optical tunneling signals with the probe tip.
Measuring cantilever deflection via light coupled through the fiber.

Main Results:

The fiber-top probe successfully detected optical tunneling signals.
Cantilever deflection was measured concurrently with optical signal detection.
The probe's design is suitable for integration with optical microscopy.

Conclusions:

Fiber-top probe technology is a viable platform for new hybrid probes.
This technology can merge atomic force microscopy and scanning near-field optical microscopy.
It paves the way for next-generation correlative microscopy tools.