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Updated: Jun 5, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Jonghan Jin1, Jae Wan Kim, Chu-Shik Kang
1Center for Length and Time, Division of Physical Metrology, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-ro, Yuseong-gu, Daejeon, 305-340, Korea. jonghan@kriss.re.kr
We developed a new method to improve optical interferometer visibility for low reflective materials. This technique amplifies weak light signals, enabling precise measurements even on surfaces with 0.6% reflectivity.
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Published on: February 27, 2013
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