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Perturbation method for the Rigorous Coupled Wave Analysis of grating diffraction.

Kofi Edee1, Jean-Pierre Plumey, Gérard Granet

  • 1Clermont Université, Université Blaise Pascal, LASMEA, BP 10448, F-63000 Cleremont–Ferrand, France. kofi.edee@univ-bpclermont.fr

Optics Express
|December 18, 2010
PubMed
Summary
This summary is machine-generated.

This study combines the perturbation method with Rigorous Coupled-Wave Analysis (RCWA) to speed up grating computations. The enhanced method efficiently calculates eigensolutions for complex gratings like trapezoidal ones.

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Area of Science:

  • Optics and Photonics
  • Computational Electromagnetics
  • Nanophotonics

Background:

  • Rigorous Coupled-Wave Analysis (RCWA) is a standard method for simulating diffraction gratings.
  • Standard RCWA approximates gratings as stacks of lamellar gratings, requiring numerous eigenvalue system solutions.
  • This computational cost increases significantly with the complexity and number of grating layers.

Purpose of the Study:

  • To enhance the computational speed of Rigorous Coupled-Wave Analysis (RCWA).
  • To develop a more efficient method for analyzing complex grating structures.
  • To evaluate the performance of the combined perturbation and RCWA method for trapezoidal gratings.

Main Methods:

  • Integration of the perturbation method with Rigorous Coupled-Wave Analysis (RCWA).
  • Utilizing eigensolutions from a reference layer to derive solutions for adjacent layers with slight parameter variations.
  • Application and evaluation of the method on a trapezoidal grating structure.

Main Results:

  • The combined perturbation and RCWA method significantly enhances computational speed compared to standard RCWA.
  • The method accurately derives eigensolutions for multilayer gratings.
  • Successful performance evaluation on a trapezoidal grating model.

Conclusions:

  • The perturbation method effectively accelerates RCWA for grating analysis.
  • This approach offers a computationally efficient alternative for simulating complex optical gratings.
  • The method shows promise for analyzing various non-lamellar grating profiles.