You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jun 5, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Kohei Yoshimoto1, Ryota Suzuki, Yasuhiko Ishikawa
1Department of Materials Engineering, the University of Tokyo, 7-3-1, Hongo Bunkyo, Tokyo 113-8656, Japan.
We demonstrate controlling silicon bandgap energy by elastically deforming silicon beams. Bending beams shifts photoluminescence peaks, enabling on-chip wavelength division multiplexing for uncooled integrated circuits.
11:08Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
Published on: November 30, 2012
06:57Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
Published on: July 17, 2020
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: