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Updated: Jun 5, 2026

Rapid Repetition Rate Fluctuation Measurement of Soliton Crystals in a Microresonator
Published on: December 15, 2021
Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation
W Ding1, A V Gorbach, W J Wadswarth
1Centre for Photonics and Photonic Materials, Department of Physics, University of Bath, Bath BA2 7AY, United Kingdom. w.ding@bath.ac.uk
Abstract:
We report time domain measurements of the group-velocity-dispersion-induced and nonlinearity-induced chirping of femtosecond pulses in subwavelength silicon-on-insulator waveguides. We observe that at a critical input power level, these two effects compensate each other leading to soliton formation. Formation of the fundamental optical soliton is observed at a peak power of a few Watts inside the waveguide. Interferometric cross-correlation traces reveal compression of the soliton pulses, while spectral measurements show pronounced dispersive waves emitted by solitons into the wavelength range of normal group velocity dispersion.

