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Scanning Electron Microscopy

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Overview of Electron Microscopy

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.

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The dermis might be considered the "core" of the integumentary system, as distinct from the epidermis and hypodermis. It contains blood and lymph vessels, nerves, and other structures, such as hair follicles and sweat glands. The dermis is made of two layers of connective tissue that comprise an interconnected mesh of elastin and collagenous fibers, produced by fibroblasts.
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Correspondence between dermoscopic features and epidermal structures revealed by scanning electron microscope.

Yoko Nagashima¹, Tetsuya Tsuchida

¹Dermatology Department, Ogawa Red Cross Hospital, Saitama, Japan. shiho1122@wave.plala.or.jp

The Journal of Dermatology

|December 24, 2010

Summary

Dermoscopic patterns of plantar melanocytic nevi correlate with the 3-D epidermal structures of the sole. Scanning electron microscopy revealed that transverse ridges on the plantar epidermis likely influence these characteristic patterns.

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Area of Science:

Dermatology
Anatomy
Microscopy

Background:

Specific dermoscopic patterns of melanocytic nevi on the sole are known to favor certain anatomical locations.
For example, parallel furrow patterns appear in weight-bearing areas, lattice-like patterns in the arch, and crista reticulated patterns at the border.

Purpose of the Study:

To investigate the relationship between the distribution of dermoscopic patterns in plantar melanocytic nevi and the three-dimensional (3-D) epidermal structures.
To understand how epidermal topography influences nevus appearance.

Main Methods:

Observation of the basal surfaces of plantar epidermis from 14 skin lesions using scanning electron microscopy (SEM).
Analysis of the 3-D morphology of transverse ridges and their arrangement.

Main Results:

SEM revealed transverse ridges forming parallel lamellae on the crista profunda limitans (limiting ridges).
The shapes of transverse ridges between the limiting ridges and crista profunda intermedia (intermediate ridges) varied based on anatomical location on the sole.
These variations in epidermal structure were observed across the 14 skin lesions.

Conclusions:

The characteristic dermoscopic patterns observed in acquired and junctional melanocytic nevi on the sole appear to mimic the arrangement of the underlying epidermal transverse ridges.
Epidermal 3-D structure is a significant factor in determining the dermoscopic appearance of plantar melanocytic nevi.