Mapping titanium and tin oxide phases using EELS: an application of independent component analysis

F de la Peña1, M-H Berger, J-F Hochepied

  • 1Laboratoire de Physique des Solides, Bât. 510, Université Paris-Sud, 91405 Orsay Cedex, France.

Ultramicroscopy
|December 28, 2010
PubMed
Summary

Independent component analysis (ICA) successfully maps challenging TiO₂-SnO₂ materials by separating spectral signals of material phases, not just elements. This advanced technique enables distinguishing between TiO₂ and SnO₂ in spinodally decomposed multilayers.

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