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Ultra-structure characterization of self-etching treated cementum surfaces
Fátima S Aguilera1, Estrella Osorio, Manuel Toledano
1Department of Dental Materials, School of Dentistry, University of Granada, Granada, Spain.
Medicina Oral, Patologia Oral Y Cirugia Bucal
|January 4, 2011
Summary
Phosphoric acid significantly increased dental cementum roughness, exposing collagen fibers. Self-etch adhesive systems showed minimal roughness changes, with One-Up Bond F yielding the lowest values at larger scan sizes.
Area of Science:
- Dental materials science
- Surface topography analysis
- Biomaterials engineering
Background:
- Dental cementum surface conditioning is crucial for adhesion.
- Understanding surface changes impacts restorative procedures.
- Atomic Force Microscopy (AFM) provides high-resolution topographical data.
Purpose of the Study:
- To evaluate the effect of different conditioning treatments on dental cementum surface roughness and topography.
- To compare phosphoric acid etching with self-etch adhesive systems (Clearfil SE Bond primer and One-Up Bond F).
Main Methods:
- Human canine teeth were prepared and subjected to four treatments: no treatment, 35% phosphoric acid, Clearfil SE Bond primer, and One-Up Bond F.
- Surface roughness and topography were analyzed using Atomic Force Microscopy (AFM) at 5x5 µm and 15x15 µm scan sizes.
- Data were statistically analyzed using ANOVA and SNK tests.
Main Results:
- Phosphoric acid treatment resulted in the highest mean surface roughness (Ra) at both scan sizes.
- No significant differences in roughness were observed among self-etch adhesive systems at 5x5 µm scans.
- One-Up Bond F exhibited the lowest roughness values at 15x15 µm scans.
Conclusions:
- Phosphoric acid conditioning significantly increases cementum surface roughness and causes demineralization, exposing collagen fibers.
- Self-etch adhesive systems, particularly One-Up Bond F, offer a less aggressive conditioning approach with minimal impact on surface roughness at larger scales.
