Updated: Jun 5, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Jianxin Wang1, Fuzhong Bai, Yu Ning
1The Laboratory on Adaptive Optics, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China. wjx_711@yahoo.com.cn
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