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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Jun 5, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Nanoscale potential measurements in liquid by frequency modulation atomic force microscopy.

Naritaka Kobayashi1, Hitoshi Asakawa, Takeshi Fukuma

  • 1Frontier Science Organization, Kanazawa University, Kakuma-machi, Kanazawa 920-1192, Japan.

The Review of Scientific Instruments
|January 5, 2011
PubMed
Summary

We developed a new method using frequency modulation atomic force microscopy (FM-AFM) for precise local potential measurements in liquids. This technique achieves nanoscale resolution, enabling detailed imaging of potential distributions on surfaces.

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Last Updated: Jun 5, 2026

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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

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Area of Science:

  • Surface Science
  • Nanotechnology
  • Electrochemistry

Background:

  • Accurate local potential measurements are crucial for understanding surface phenomena in liquids.
  • Existing methods may be limited by electrochemical side reactions or lower resolution.

Purpose of the Study:

  • To present a novel method for nanoscale local potential measurements in liquid environments.
  • To demonstrate the capability of frequency modulation atomic force microscopy (FM-AFM) for this application.

Main Methods:

  • Utilizing frequency modulation atomic force microscopy (FM-AFM) with an applied AC bias voltage.
  • Calculating local potential from the first and second harmonic cantilever vibrations.
  • Employing high-frequency AC bias to mitigate unwanted electrochemical reactions.

Main Results:

  • Successfully measured local potential with nanoscale resolution in a liquid.
  • Demonstrated the method by imaging the potential distribution of a dodecylamine thin film on graphite.
  • Confirmed the prevention of uncontrolled electrochemical reactions and ion/water redistribution.

Conclusions:

  • The developed FM-AFM method provides a robust approach for high-resolution local potential mapping in liquids.
  • This technique is suitable for studying potential distributions at the nanoscale without perturbing the sample environment.