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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Jun 5, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization.

Lan Zhang¹, Yang Ju, Atsushi Hosoi

¹Department of Mechanical Science and Engineering, Nagoya University, Furo-Cho, Chikusa-ku, Nagoya 4648603, Japan.

The Review of Scientific Instruments

|January 5, 2011

Summary

We developed microwave atomic force microscopy (AFM) to simultaneously map surface topography and electrical properties of materials at the nanoscale. This new technique achieved 120 nm resolution imaging of a gold film on glass.

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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

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Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

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Area of Science:

Materials Science
Physics
Nanotechnology

Background:

Characterizing nanoscale surface topography and electrical properties of materials is crucial for advanced applications.
Existing techniques often require separate measurements or lack simultaneous capability.

Purpose of the Study:

To introduce a novel microscopy technique for simultaneous nanoscale surface topography and electrical property investigation.
To demonstrate the capability of the new technique on conductive and dielectric materials.

Main Methods:

Combined principles of scanning probe microscopy and microwave measurement techniques.
Utilized noncontact atomic force microscopy (AFM) operating conditions.
Applied microwave measurement for electrical property analysis.

Main Results:

Successfully generated a microwave image of a 200-nm gold film on a glass wafer substrate.
Achieved a spatial resolution of 120 nm.
Measured a voltage difference of 19.2 mV between the gold film and glass substrate.

Conclusions:

The developed microwave atomic force microscopy enables simultaneous nanoscale surface topography and electrical property mapping.
The technique shows promise for analyzing diverse materials, including conductive and dielectric ones.
This advancement offers a powerful tool for nanoscale material characterization.