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Updated: Jun 5, 2026

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
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Field fluctuations and fractality in electrical breakdown trees

P L Dammig Quiña1, I M Irurzun, L M Salvatierra

  • 1CCT La Plata-CONICET, Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas (INIFTA), Facultad de Ciencias Exactas, Universidad Nacional de La Plata, La Plata, Repúblic of Argentina.

Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics
|January 15, 2011
PubMed

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