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In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

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Field fluctuations and fractality in electrical breakdown trees.

P L Dammig Quiña¹, I M Irurzun, L M Salvatierra

¹CCT La Plata-CONICET, Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas (INIFTA), Facultad de Ciencias Exactas, Universidad Nacional de La Plata, La Plata, Repúblic of Argentina.

Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics

|January 15, 2011

Summary

This study modifies the discharge avalanche model to investigate space-charge effects on electric tree fractals. The findings reveal nonmonotonic behaviors and voltage-dependent transitions in tree growth and failure times.

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Area of Science:

Materials Science
Electrical Engineering
Physics

Background:

Electric trees are fractal structures formed during dielectric breakdown in polymers.
Understanding their formation is crucial for predicting material failure.
Space-charge effects are known to influence electrical discharge phenomena.

Purpose of the Study:

To explore the role of space-charge characteristics in the fractal nature of electric trees.
To modify the discharge avalanche model to incorporate local electrical field fluctuations.
To correlate model predictions with experimental data.

Main Methods:

Modification of the Dissado discharge avalanche model.
Inclusion of stochastic fluctuations in the local electrical field (E(loc)) around the Laplacian field (E(lap)).
Limiting fluctuations to intermediate values of E(lap).

Main Results:

Prediction of nonmonotonic behavior in average time to failure.
Prediction of nonmonotonic behavior in the average fractal dimension of electric trees.
Prediction of a transition from branched to runaway electric trees with increasing applied voltage.

Conclusions:

Space-charge characteristics significantly influence the fractal geometry and failure dynamics of electric trees.
The modified model provides insights into the complex behavior of dielectric breakdown.
The model successfully predicts voltage-dependent transitions in electric tree morphology.