Related Experiment Video
Updated: Jun 5, 2026

Atomically Defined Templates for Epitaxial Growth of Complex Oxide Thin Films
Published on: December 4, 2014
Direct subangstrom measurement of surfaces of oxide particles
1Beijing National Center for Electron Microscopy, Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China. ryu@tsinghua.edu.cn
Abstract:
Using aberration-corrected transmission electron microscopy combined with first-principles calculations, we show that the surface structure of Co3O4, a typical complex oxide, can be directly imaged and quantitatively analyzed at the subangstrom scale. The atomic positions of both light oxygen and heavier cobalt within the surface layers have been measured to an accuracy of several picometers. The surface electronic structure analysis suggests a polarity compensation model based on the electronic polarizability of surface ions.
More Related Videos
08:31Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
Published on: February 10, 2021
10:27The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight
Published on: October 11, 2016