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10:49
Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy
Published on: November 28, 2014
Surface potential mapping of SAM-functionalized organic semiconductors by Kelvin probe force microscopy
David J Ellison1, Bumsu Lee, V Podzorov
1Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, 55455, USA.
Advanced Materials (Deerfield Beach, Fla.)
|January 22, 2011
Abstract
No abstract available in PubMed .
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