Truncated versus extended microfilms at a vapor-liquid contact line on a heated substrate

The microstructure of a contact line formed by a liquid and its pure vapor on a perfectly wetted superheated smooth substrate, with the disjoining pressure most often in the form of a positive inverse cubic law (nonpolar case), is routinely considered to end up in a microfilm extended over adjacent "dry" parts of the solid surface. Invoking the spreading coefficient as an additional independent parameter within this framework, we argue however that a regime with a truncated microfilm is chosen instead if the spreading coefficient is decreased below a positive (still perfect wetting) critical value dependent upon the superheat, in which case the extended-microfilm thickness is surpassed by that of the "pancake" introduced by de Gennes and co-workers. Conversely, for a given positive spreading coefficient, there is a critical superheat above which the microfilm gets truncated, whereas for a negative one (partial wetting) the truncated regime should be preferred at any superheat. A parametric study of the apparent contact angle (a nonlinear eigenvalue of the steady microstructure problem) versus the spreading coefficient is carried out. When the latter is negative, Young's law is asymptotically recovered. Microfilm fronts on a bare surface are shown to be advancing or receding in accordance with the selected regime. A slightly more general class of disjoining pressures is also touched upon. The analysis is based in part upon thermodynamic considerations and in part upon a standard one-sided model of an evaporating liquid layer in the lubrication approximation.