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Updated: Jun 5, 2026

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Dynamic phase measurement in shearography by clustering method and Fourier filtering.
Yuanhao Huang1, Farrokh Janabi-Sharifi, Yusheng Liu
1State Key Laboratory of CAD&CG, Zhejiang University, Hangzhou, China.
This study introduces a novel method for dynamic phase measurement using optical techniques. It effectively extracts phase information from single images, overcoming limitations of traditional methods for rapidly deforming objects.
Area of Science:
- Optical Measurement
- Metrology
- Image Processing
Background:
- Phase shifting techniques are standard for static measurements but unsuitable for dynamic scenarios.
- Fourier transform methods require high-frequency carriers, which are difficult to generate.
- Existing single-image methods struggle with high fringe densities, leading to phase residues.
Purpose of the Study:
- To develop an ideal solution for dynamic phase measurement.
- To enable accurate phase extraction from single images during continuous deformation.
- To address limitations of current methods in high-fringe-density situations like shearography.
Main Methods:
- Initial phase analysis using four phase-shifted images at a reference stage.
- Clustering phase extraction for deformation phase from single images.
- Fourier transform-based phase filtering for fringe frequency analysis and residue removal.
Main Results:
- The proposed method successfully extracts phase information from single images during dynamic deformation.
- Clustering phase extraction is effective for low to medium fringe densities.
- Fourier transform-based filtering significantly improves wrapped phase map quality by removing residues in high-density fringe cases.
Conclusions:
- The integrated dynamic phase extraction method offers an effective solution for optical measurements of deforming objects.
- The combination of clustering and Fourier transform filtering enhances accuracy and robustness.
- This approach is particularly beneficial for dynamic shearography applications.
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