Snap-shot profilometry with the Empirical Mode Decomposition and a 3-layer color sensor

Area of Science:

• Optics and Photonics
• Computer Vision
• Metrology

Background:

• Remote sensing and full-field measurement techniques are increasingly vital across various industries.
• Fringe projection techniques are crucial for high-accuracy, high-resolution 3D measurements.
• Demand for dynamic regime measurements in full-field techniques is growing.

Purpose of the Study:

• To present the first use of a 3-layer CMOS color sensor (Foveon X3) in an RGB fringe projection system.
• To introduce specialized processing methods tailored for this unique sensor.
• To address the challenges of simultaneous pattern recording and color separation.

Main Methods:

• Utilizing a 3-layer CMOS color sensor for simultaneous recording of three phase-shifted fringe patterns.
• Developing specific color transformation algorithms to separate RGB projected fringe patterns.
• Employing Empirical Mode Decomposition for equalizing non-uniform sensor layer responses.

Main Results:

• Demonstrated the feasibility of using a 3-layer CMOS sensor for RGB fringe projection.
• Successfully separated three phase-shifted fringe patterns captured simultaneously.
• Showcased a method for equalizing spectral response variations across sensor layers.

Conclusions:

• The 3-layer CMOS sensor offers a unique advantage for simultaneous fringe pattern acquisition in RGB systems.
• Specialized processing, including color transformation and Empirical Mode Decomposition, is effective for this sensor.
• This system advances the potential for accurate and dynamic 3D measurements using fringe projection.