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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Compact sensor for measuring two-dimensional tilt using a two-dimensional transmission grating and the Talbot effect.

Koichi Iwata¹, Kazuo Satoh, Kousuke Moriwaki

¹Lumino, 18-1, Daishi, Kawachi-Nagano, Osaka, 586-0041, Japan. k‐iwata@hkg.odn.ne.jp

|January 26, 2011

Summary

This study introduces a compact two-dimensional tilt sensor utilizing the Talbot effect and a hexagonal grating. It accurately measures small tilts by analyzing diffraction pattern displacement via Fourier transforms.

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Area of Science:

Optics and Photonics
Metrology and Instrumentation

Background:

Existing tilt sensors often lack precision for small two-dimensional movements.
The Talbot effect offers a unique principle for optical measurements based on diffraction.

Purpose of the Study:

To develop and validate a novel two-dimensional tilt sensor.
To extend previous one-dimensional Talbot effect sensor designs to two dimensions.

Main Methods:

Utilized the Talbot effect with a hexagonal grating and a reflective object.
Employed an image sensor placed at a Talbot distance to capture diffraction intensity.
Applied Fourier transform methods to calculate diffraction pattern displacement for tilt determination.

Main Results:

Demonstrated a functional two-dimensional tilt sensor based on the proposed principle.
Experimental validation using a hexagonal grating confirmed the sensor's capability.
The sensor exhibits simplicity and compactness in its design.

Conclusions:

The proposed Talbot effect-based sensor effectively measures two-dimensional tilt.
The design is simple, compact, and shows promise for practical applications.
Further discussions are provided to enhance the sensor's real-world applicability.