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Transmission Electron Microscopy
Atomic Emission Spectroscopy: Instrumentation
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An Experimental Protocol for Femtosecond NIR/UV - XUV Pump-Probe Experiments with Free-Electron Lasers
Published on: October 23, 2018
Jose V Mathew1, Sudeep Bhattacharjee
1Department of Physics, Indian Institute of Technology, Kanpur, Uttar Pradesh, India.
A double Einzel lens system (ELS) significantly improves focused ion beam quality, reducing emittance by 44% compared to a single ELS. Grounding apertures further enhance performance, achieving a 10 μm beam spot size.
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