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Updated: Jun 4, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
Optical detection system for probing cantilever deflections parallel to a sample surface
A Labuda1, T Brastaviceanu, I Pavlov
1Department of Physics, Faculty of Science, McGill University, Montreal, Canada.
Abstract:
To date, commercial atomic force microscopes have been optimized for measurements of forces perpendicular to the sample surface. In many applications, sensitive parallel force measurements are desirable. These can be obtained by positioning the cantilever with its long axis perpendicular to the sample: the so-called pendulum geometry. We present a compact optical beam deflection system which solves the geometrical constraint problems involved in focusing a light beam onto a cantilever in the pendulum geometry. We demonstrate the performance of the system on measurements of forces imparted by a muscle myofibril, which is in-plane to a high-magnification objective of an optical microscope.
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