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Scanning Electron Microscopy

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Related Experiment Video

Updated: Jun 4, 2026

Identification of Metal Oxide Nanoparticles in Histological Samples by Enhanced Darkfield Microscopy and Hyperspectral Mapping

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Published on: December 8, 2015

Material classification of nanoparticles by focused beam scattering.

Evyatar Hemo¹, Boris Spektor, Joseph Shamir

¹Department of Electrical Engineering, Technion-Israel Institute of Technology, Haifa, Israel. evyatarhemo@gmail.com

|February 2, 2011

Summary

This study demonstrates classifying single particles by material composition using focused light scattering patterns. This overcomes limitations of conventional methods analyzing large particle ensembles.

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Last Updated: Jun 4, 2026

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Published on: September 13, 2020

Area of Science:

Optics and photonics
Materials science
Nanotechnology

Background:

Detecting micrometer and nanometer particles by composition is crucial for advanced science and technology.
Conventional methods using wide-field illumination struggle to analyze single particles due to weak light interaction.
Information about individual particle properties is lost when analyzing large ensembles.

Purpose of the Study:

To develop a method for classifying single particles based on their material composition.
To overcome the limitations of conventional ensemble-based particle analysis.
To leverage light scattering patterns for individual particle characterization.

Main Methods:

Utilizing a focused Gaussian beam for illumination.
Analyzing the distinct scattering patterns generated by single particles.
Correlating scattering patterns with the material composition of individual particles.

Main Results:

Successfully classified single particles by their material composition.
Demonstrated the effectiveness of focused beam scattering for individual particle analysis.
Showcased a significant improvement over conventional ensemble methods.

Conclusions:

Analyzing the scattering pattern of a focused Gaussian beam enables single particle classification by material.
This technique offers a novel approach for characterizing individual micro- and nanoparticles.
The findings have implications for various scientific and technological fields requiring precise particle analysis.