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Single Plane Illumination Module and Micro-capillary Approach for a Wide-field Microscope
Published on: August 15, 2014
Design of a normal incidence multilayer imaging x-ray microscope
D L Shealy1, D R Gabardi, R B Hoover
1Department of Physics, University of Alabama at Birmingham, Birmingham, Alabama 35294.
Journal of X-Ray Science and Technology
|February 11, 2011
Summary
Doubly reflecting multilayer x-ray optics are feasible, enabling high-resolution solar imaging. This technology paves the way for advanced aplanatic imaging soft x-ray microscopes for diverse scientific applications.
Area of Science:
- X-ray optics and instrumentation
- Solar physics
- Microscopy
Background:
- Normal incidence multilayer Cassegrain x-ray telescopes were successfully deployed.
- These instruments provided high spatial resolution solar images.
- Feasibility of doubly reflecting multilayer x-ray optical systems was demonstrated.
Purpose of the Study:
- To design a doubly reflecting normal incidence multilayer imaging x-ray microscope.
- To achieve aplanatic imaging using multilayer optics technology.
- To explore applications in advanced scientific research.
Main Methods:
- Design based on the Schwarzschild configuration using two spherical mirrors.
- Optimization of mirror curvature to minimize spherical aberration and coma.
- Optical system ray trace analysis to predict performance.
Main Results:
- Ray trace analysis indicates diffraction-limited performance.
- Predicted spatial resolution of 600 Å over a 1 mm field of view at 100 Å wavelength.
- Microscope designs are currently in fabrication.
Conclusions:
- Aplanatic imaging soft x-ray microscopes are achievable with multilayer optics.
- These microscopes offer significant potential for x-ray astronomy, lithography, and research.
- Further applications include biological, biomedical, metallurgical, and laser fusion research.
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