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In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Studies of multilayers and thin-foil x-ray mirrors using a soft x-ray diffractometer.

F E Christensen1, A Hornstrup, P Frederiksen

  • 1Danish Space Research Institute, Gl. Lundtoftevej 7, DK-2800 Lyngby, Denmark.

Journal of X-Ray Science and Technology
|February 11, 2011
PubMed
Summary

A versatile x-ray diffractometer was detailed for studying x-ray optical elements. Multilayer coatings and thin-foil reflectors were analyzed using Bragg reflection and reflectivity studies at MgKα.

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Area of Science:

  • Materials Science
  • Optics
  • Physics

Background:

  • X-ray optical elements are crucial for various applications, including satellite missions.
  • Characterizing multilayer coatings and thin-foil reflectors requires precise experimental techniques.

Purpose of the Study:

  • To describe a versatile x-ray diffractometer and demonstrate its utility.
  • To investigate the performance of advanced multilayer coatings on different substrates.
  • To evaluate thin-foil x-ray reflectors for future space-based observatories.

Main Methods:

  • Detailed description of a newly developed versatile x-ray diffractometer.
  • Bragg reflection analysis of multilayer coatings on silicon wafer, fused quartz, and electroless nickel substrates.
  • Reflectivity and scattering measurements of thin-foil x-ray reflectors.

Main Results:

  • Bragg reflection data for multilayers were obtained and compared with previous FeKα measurements.
  • Reflectivity and scattering data were acquired for thin-foil reflectors.
  • The performance of different substrate materials for multilayers was assessed.

Conclusions:

  • The versatile x-ray diffractometer is effective for characterizing x-ray optical elements.
  • The study provides valuable data for the development of advanced x-ray optics for scientific applications.
  • The findings support the selection and design of components for upcoming x-ray satellite missions.