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Updated: Jun 4, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Studies of multilayers and thin-foil x-ray mirrors using a soft x-ray diffractometer
F E Christensen1, A Hornstrup, P Frederiksen
1Danish Space Research Institute, Gl. Lundtoftevej 7, DK-2800 Lyngby, Denmark.
Abstract:
A versatile x-ray diffractometer is described in detail. Two applications to the study of x-ray optical elements are presented. The first is a Bragg reflection study of state-of-the-art multilayers deposited both on conventional Si-wafer substrates and on superpolished substrates such as fused quartz and electroless nickel. These data are compared to data previously obtained at FeKα. The second study is a reflectivity and scattering study of various thin-foil x-ray reflectors proposed for up-coming x-ray satellite missions. All the data have been obtained at MgKα = 1.2536 keV.
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