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New Concepts for X-Ray, Soft X-Ray, and EUV Optical Instrumentation Including Applications in Spectroscopy, Plasma

V L Kantsyrev1, R Bruch, R Phaneuf

  • 1University of Nevada Reno, Reno, Nevada 89557.

Journal of X-Ray Science and Technology
|February 11, 2011
PubMed

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