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Updated: Jun 4, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Published on: August 25, 2016

Focusing Properties of X-Ray Spectrometers with 2D-Curved Crystals for Extended X-Ray Sources of Hot Plasmas

B S Fraenkel1, M Bitter, S von Goeler

  • 1Laboratory of X-Ray and VUV Spectroscopy, Racah Institute of Physics, Hebrew University, Jerusalem, Israel.

Journal of X-Ray Science and Technology
|February 11, 2011
PubMed

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