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Updated: Jun 4, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
Kevin Mader1, Federica Marone, Christoph Hintermüller
1Swiss Light Source, Paul Scherrer Institute, Villigen, Switzerland.
A new automated system at the TOMCAT beamline enables high-throughput X-ray computed tomography (CT) by handling sample exchange and scanning without user intervention. This innovation significantly boosts research efficiency for materials science and other fields requiring rapid 3D imaging.
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