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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Numerical optimization of spherical variable-line-spacing grating X-ray spectrometers.

V N Strocov¹, T Schmitt, U Flechsig

¹Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen-PSI, Switzerland. vladimir.strocov@psi.ch

Journal of Synchrotron Radiation

|February 22, 2011

Summary

This study optimizes spherical variable-line-spacing (VLS) grating spectrometers for high resolution. The design minimizes aberrations, enhancing spectral resolution and acceptance over a wide energy range.

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Area of Science:

Optics and Spectroscopy
X-ray Instrumentation

Background:

Spherical gratings with variable line spacing (VLS) are crucial for high-resolution X-ray spectroscopy.
Aberrations, particularly coma, limit the performance of VLS grating spectrometers.

Purpose of the Study:

To optimize the design of spherical VLS grating spectrometers for high resolving power and large acceptance.
To develop a design methodology for aberration-free operation over an extended energy range.

Main Methods:

Utilized dedicated ray-tracing software for rapid optimization of grating parameters and spectrometer geometry.
Analyzed optical path function, focusing on the coma term, for aberration analysis.
Evaluated correction strategies for entrance arm and grating incidence angle.

Main Results:

Achieved a resolving power exceeding 20,400 at 930 eV for a model spectrometer.
Minimized coma aberrations and symmetric broadening, significantly increasing vertical acceptance.
Demonstrated methods to maintain symmetric lineshapes and optimize operational modes for energy-independent focal curves or maximal acceptance.

Conclusions:

The developed design approach enables high-resolution spherical VLS grating spectrometers with negligible aberrations.
The methodology provides a recipe for designing spectrometers with large acceptance and broad energy coverage.