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Related Experiment Video

Updated: Jun 4, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F⁻

Published on: July 27, 2018

Electron ionization of SiCl4.

Simon J King¹, Stephen D Price

¹Department of Chemistry, University College London, London, United Kingdom. Simon-john.king@bristol.ac.uk

The Journal of Chemical Physics

|February 24, 2011

Summary

This study quantifies fragment ion formation from silicon tetrachloride (SiCl4) electron ionization. New data reveal insights into dissociative ionization mechanisms and energetics, including first-time measurements for Cl2+ formation.

Area of Science:

Physical Chemistry
Atomic and Molecular Physics
Mass Spectrometry

Background:

Understanding molecular fragmentation under electron impact is crucial for various fields.
Silicon tetrachloride (SiCl4) is an important industrial chemical, but its electron ionization fragmentation pathways are not fully elucidated.
Previous studies on SiCl4 ionization have limitations in distinguishing fragmentation contributions.

Purpose of the Study:

To determine relative partial ionization cross sections (PICS) for fragment ions from SiCl4 electron ionization.
To differentiate contributions from single, double, and triple ionization to fragment ion yields.
To provide the first quantitative measurements of Cl2+ formation and ion pair production via dissociative double ionization.

Main Methods:

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Published on: March 1, 2020

Time-of-flight mass spectrometry combined with an ion coincidence technique.
Electron ionization of SiCl4 in the energy range of 30-200 eV.
Analysis of 2D ion coincidence data to study dissociation mechanisms.

Main Results:

Relative precursor-specific PICS for SiCl4 fragment ions were determined for the first time.
Distinguished contributions from single and double ionization to singly charged fragment ions.
Reported the first quantitative measurements of Cl2+ fragment ion formation and ion pair production.
Identified the lowest energy dicationic precursor state for SiCl4 at 27.4 ± 0.3 eV.

Conclusions:

The study provides a comprehensive dataset of relative PICS for SiCl4 fragment ions.
Insights into the mechanisms of dissociative ionization, particularly the role of double ionization, were gained.
The findings offer valuable data for understanding the fundamental processes of molecular ionization and fragmentation.