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Single Molecule Fluorescence Microscopy on Planar Supported Bilayers
Published on: October 31, 2015
Characterization and inspection of microlens array by single cube beam splitter microscopy.
Weijuan Qu1, Oi Choo Chee, Yingjie Yu
1Ngee Ann Polytechnic, 535 Clementi Road, 599489 Singapore. qwe2@np.edu.sg
Applied Optics
|February 24, 2011
Summary
A novel single cube beam splitter (SCBS) microscope enables efficient micro-optics characterization. This SCBS microscope provides dual-channel imaging and off-axis digital holograms for detailed microlens array uniformity inspection.
Area of Science:
- Optics and Photonics
- Microscopy
- Optical Engineering
Background:
- Micro-optics characterization requires precise and efficient methods.
- Existing techniques may lack the capability for comprehensive uniformity inspection.
Purpose of the Study:
- To present a single cube beam splitter (SCBS) microscope for advanced micro-optics characterization.
- To demonstrate the SCBS microscope's unique capabilities in digital holography and dual-channel imaging.
Main Methods:
- Utilizing a single cube beam splitter (SCBS) in the microscope's optical path.
- Positioning the SCBS at a small angle to the optical axis for off-axis holography and dual-channel imaging.
- Applying the SCBS microscope to microlens array uniformity inspection.
Main Results:
- The SCBS microscope generates off-axis digital holograms and dual-channel images.
- Demonstrated effectiveness in physical spherical phase compensation and single lens characterization.
- Successfully performed uniformity inspection across a microlens array.
Conclusions:
- The SCBS microscope offers a unique and straightforward approach to micro-optics characterization.
- Its dual-channel imaging and holographic capabilities are highly beneficial for uniformity assessment.
- SCBS microscopy presents a valuable tool for optical component analysis.
