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Updated: Jun 4, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

Silicon multi-branch nanostructures for decent field emission and excellent electrical transport

Min Sun1, Yihua Gao, Chunyi Zhi

  • 1Wuhan National Laboratory for Optoelectronics-School of Physics, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China.

Nanotechnology
|March 4, 2011
PubMed

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