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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
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An environment-dependent interatomic potential for silicon carbide: calculation of bulk properties, high-pressure

G Lucas1, M Bertolus, L Pizzagalli

  • 1Sulzer Metco AG, Rigackerstrasse 16, CH-5610 Wohlen, Switzerland.

Journal of Physics. Condensed Matter : an Institute of Physics Journal
|March 10, 2011
PubMed

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