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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Electronic and elastic properties of new semiconducting oP(12)-type RuB(2) and OsB(2)

Xianfeng Hao1, Yuanhui Xu, Faming Gao

  • 1Key Laboratory of Applied Chemistry, Yanshan University Qinhuangdoa 066004, People's Republic of China. xfhao1980@yahoo.com.cn

Journal of Physics. Condensed Matter : an Institute of Physics Journal
|March 10, 2011
PubMed

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