Imperfections in Crystal Structure: Stoichiometric Point Defects
Imperfections in Crystal Structure: Non-Stoichiometric Defects
Imperfections in Crystal Structure: Point, Line and Plane Defects
Metal-Semiconductor Junctions
Fermi Level Dynamics
Types of Semiconductors
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Updated: Jun 3, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Fumiyasu Oba1, Minseok Choi, Atsushi Togo
1Department of Materials Science and Engineering, Kyoto University, Sakyo, Kyoto 606-8501, Japan. oba@cms.mtl.kyoto-u.ac.jp
This study investigates native defects in oxide semiconductors like ZnO, SrTiO3, and SnO. For ZnO, hydrogen impurities, not native defects, likely cause n-type conductivity, while Ti antisites are key in SrTiO3.
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