Related Experiment Video
Updated: Jun 3, 2026

Production of Synthetic Nuclear Melt Glass
Published on: January 4, 2016
Uranium surroundings in borosilicate glass from neutron and x-ray diffraction and RMC modelling
M Fábián1, Th Proffen, U Ruett
1Research Institute for Solid State Physics and Optics, POB 49, H-1525 Budapest, Hungary. fabian@szfki.hu
Abstract:
Neutron and high-energy x-ray diffraction measurements have been performed on multi-component 55SiO(2)·10B(2)O(3)·25Na(2)O·5BaO·ZrO(2) borosilicate host glass loaded with 30 wt% UO(3). Both the traditional Fourier transformation technique and the reverse Monte Carlo simulation of the experimental data have been applied to get structural information. It was established that the basic network structure consists of tetrahedral SiO(4) units and of mixed tetrahedral BO(4) and trigonal BO(3) units, similar to the corresponding host glass. Slight changes have been observed in the oxygen surroundings of the Na and Zr modifier cations; both the Na-O and Zr-O distances decrease and a more compact short-range structure has been obtained compared to the host glass. For the U-O correlations two distinct peaks were resolved at 1.84 and 2.24 Å, and for higher distances intermediate-range correlations were observed. Significant correlations have been revealed between U and the network former Si and B atoms. Uranium ions take part in the network forming, which may be the reason for the observed good glassy stability and hydrolytic properties.
More Related Videos
07:52A Novel Technique for Raman Analysis of Highly Radioactive Samples Using Any Standard Micro-Raman Spectrometer
Published on: April 12, 2017
09:18Laser-heating and Radiance Spectrometry for the Study of Nuclear Materials in Conditions Simulating a Nuclear Power Plant Accident
Published on: December 14, 2017
Related Concept Videos
X-ray Diffraction of Biological Samples
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are scattered by the electron clouds around the sample atoms. The X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
Determination of Crystal Structures