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Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
Three-Dimensional Analysis of Strain01:29

Three-Dimensional Analysis of Strain

Three-dimensional strain analysis is crucial for understanding how materials deform under stress, particularly in elastic, homogeneous materials. This method employs principal stress axes to simplify complex stress states into more understandable forms. Subjected to stress, a small cubic element within a material either expands or contracts along these axes, transforming into a rectangular parallelepiped. This transformation effectively illustrates the material's deformation. The principal...

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Related Experiment Video

Updated: Jun 3, 2026

Stress Distribution During Cold Compression of Rocks and Mineral Aggregates Using Synchrotron-based X-Ray Diffraction
10:36

Stress Distribution During Cold Compression of Rocks and Mineral Aggregates Using Synchrotron-based X-Ray Diffraction

Published on: May 20, 2018

Quantitative strain analysis of surfaces and interfaces using extremely asymmetric x-ray diffraction.

Koichi Akimoto1, Takashi Emoto

  • 1Graduate School of Engineering, Nagoya University, Nagoya, 464-8603, Japan. akimoto@nagoya-u.jp

Journal of Physics. Condensed Matter : an Institute of Physics Journal
|March 10, 2011
PubMed
Summary

Measuring lattice strain is crucial for controlling electronic device reliability. An advanced x-ray diffraction technique allows precise, quantitative strain analysis at surfaces and interfaces, improving material stability and performance.

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Related Experiment Videos

Last Updated: Jun 3, 2026

Stress Distribution During Cold Compression of Rocks and Mineral Aggregates Using Synchrotron-based X-Ray Diffraction
10:36

Stress Distribution During Cold Compression of Rocks and Mineral Aggregates Using Synchrotron-based X-Ray Diffraction

Published on: May 20, 2018

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Determining the Mechanical Strength of Ultra-Fine-Grained Metals
05:04

Determining the Mechanical Strength of Ultra-Fine-Grained Metals

Published on: November 22, 2021

Area of Science:

  • Materials Science
  • Solid-State Physics
  • Surface Science

Background:

  • Lattice strain negatively impacts carrier mobility, device reliability, thin film growth, and crystal stability.
  • Accurate measurement of minute lattice strain at surfaces and interfaces is essential for controlling these effects.

Purpose of the Study:

  • To review quantitative strain analysis studies using an advanced x-ray diffraction method.
  • To demonstrate the application of this technique for various material systems.

Main Methods:

  • Utilized an extremely asymmetric x-ray diffraction method.
  • Employed Darwin's dynamical x-ray diffraction theory for quantitative strain evaluation.

Main Results:

  • Successfully performed quantitative strain analysis on diverse interfaces and surfaces.
  • Investigated native SiO(2)/Si interfaces, reconstructed Si surfaces, Ni/Si(111)-H interfaces, sputtered III-V compound semiconductor surfaces, high-k/Si interfaces, and Au ion-implanted Si.

Conclusions:

  • The extremely asymmetric x-ray diffraction method provides a powerful tool for quantitative strain analysis.
  • This technique is vital for understanding and controlling strain in advanced electronic materials and devices.