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Simulation, Fabrication and Characterization of THz Metamaterial Absorbers
Published on: December 27, 2012
Deposited metamaterial thin film with negative refractive index and permeability in the visible regime
Yi-Jun Jen1, Chih-Hui Chen, Ching-Wei Yu
1Department of Electro-Optical Engineering, National Taipei University of Technology, Taipei, Taiwan. jyjun@ntut.edu.tw
Optics Letters
|March 16, 2011
Abstract:
Thin films are fabricated from arrays of silver nanorods with thicknesses of 160 nm and 200 nm, to function as a metamaterial. The negative refractive index and negative permeability are retrieved from measured reflection and transmission coefficients using walk-off interferometer in the visible regime. A negative-index-material thin film with negative permittivity or (and) permeability can be produced by glancing angle deposition.
